Shimadzu Corporation announced on June 20, 2013 that it has begun to sell electrode inspection equipment "SCI-8P" for electrode printing applications in the manufacturing process of crystalline silicon solar cells.
This product incorporates a 35μm/pixel high-resolution camera and self-developed image processing technology to inspect fine electrodes, leading to early detection of defects such as electrode thickness, breakage, and print position deviations that result in decreased solar cell conversion efficiency. It can prevent the long-term shutdown caused by the stop of the production line, and can also improve the pass rate of the electrode.
In addition, it is also possible to detect cracks, protrusions, and particles, film thickness, and distribution of the antireflection film on the wafer. The product can perform electrode inspection and wafer appearance inspection at the same time, and a wafer inspection time is less than 1 second.
In the field of solar cell inspection equipment, Shimadzu Corporation launched two models in March 2013. One is a composite inspection device “SCI-8SM†that can simultaneously perform micro crack inspection and wafer appearance inspection. The model is the industry's smallest visual inspection device "SCI-8S", which is mainly sold to companies in Japan, China, and Taiwan. This time, new products SCI-8P have been added to the product line, which will improve the pass rate and power generation efficiency. This series of products can be used not only for new production lines, but also for additional installation in the limited space of existing production lines. The dimensions, including lighting power, are 307mm x 311mm x 840mm. It plans to sell 20 units in the first year of listing. (Reporter: Chi Chie, Tech-On!)
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